SMU with high channel density accelerates characterization of semiconductors

SMU with high channel density accelerates characterization of semiconductors

Keysight Technologies introduces the PZ2100 series high channel density precision SMU (Source Measure Unit). It gives digital circuit designers 20 precision SMU channels in a 1U rack for faster characterization of IC designs.

During the design cycle, multiple ports must be connected and tested on a single device under test (DUT) to troubleshoot and characterize IC performance. Without automated high-density characterization, development can slow down due to the need to validate complex multi-port designs over complicated low-density test setups.

Keysight's PZ2100 Series SMU offers a high-density solution scalable to 20 channels in a compact 1U rack configuration. This accelerates time to market with flexible software options, simplified system integration and application-specific measurement capabilities. The single-box solution to simplify channel stacking and synchronization reduces integration and coding complexity. The GUI accelerates test prototyping, troubleshooting and debugging, while the PathWave IV curve measurement software enables fast measurements and synchronization without programming. Up to 20 SMU channels in a full-width 1U form factor save rack space. Five configurable and upgradeable module options are available. The integration of pulse generator and digitizer functions into traditional SMU functions, such as precise DC power supply and measurement, meets new requirements without additional measurement devices.

  • Issue: Januar
  • Year: 2020
Image

Eugen G. Leuze Verlag GmbH & Co. KG
Karlstraße 4
88348 Bad Saulgau

Tel.: 07581 4801-0
Fax: 07581 4801-10
E-Mail: info@leuze-verlag.de

 

Melden Sie sich jetzt an unserem Newsletter an: