The rigid pin adapters for Microcontact test systems - such as the MCit manual test device or the MCom fully automatic machine - enable the contacting of the finest test structures and test point distances on assembled and unassembled substrates. The adapters can be used to optimize the layout, achieve a higher test density and reduce production costs. Thanks to the very long service life that can be achieved and the fact that service work can be carried out independently in a short time, maintenance costs are also low.
In the bareboard test, test points with a diameter of 40 μm can be contacted at pitch distances of 80 μm. Over 450 test points/cm² can be resolved selectively. Even the most sensitive surfaces can be contacted.
Due to the precise needle guidance and the low wobble clearance, even the finest structures can be tapped on populated substrates. With the Sirius adapters, the needles emerge vertically from the adapter with minimal wobble, which means that the test points can be made even smaller and contact can be made even closer to components. Simply by reducing the test point from ø0.8 mm to ø0.2 mm, the required test point area can be reduced by a factor of 16.
Micro Contact supports users in solving challenges - the corresponding adapters can be produced with delivery times of 3 weeks thanks to optimized internal processes, in-house drilling software and close cooperation between the departments involved.
