The Fraunhofer Institute for Reliability and Microintegration IZM in Berlin has expanded its institute management: Since August 1, 2024, Prof. Ulrike Ganesh has headed the IZM together with Prof. Martin Schneider-Ramelow. Together they will continue to develop the strategic direction.
Prof. Ganesh brings her experience from many years of research in the field of characterization and failure analysis of semiconductor technologies. She began her career as a postdoc at IBM in New York. She was then responsible for failure analysis research at Qualcomm in San Diego. Prof. Ganesh expanded her management experience in automotive chip development at Robert Bosch.
Most recently, she headed the 'Non-destructive Testing' department at the Federal Institute for Materials Research and Testing. With their complementary skills, the new dual leadership aims to successfully master the challenges of microelectronics research.
