The Fineliner parallel tester from MicroContact enables double-sided contacting on fine structures. By visually detecting both sides of the substrate and correcting the adapter position accordingly, ≥ 300 μm test points can be contacted.
The rigid needle adapter with a pitch of ≥ 400 μm also allows a high contact density. This results in a large test depth on the substrate. The integrated DMC reader ensures correct test result assignment. Multiple panels can be stitched through in the fineliner in the X direction, further eliminating substrate tolerances in the X direction and enabling more cost-effective adapters and measuring techniques. A quick clamping system with identifiable changeover sets ensures safe and fast changeover. The measurement technology can be defined according to customer specifications. There are 2040 pylon interface points available per side.
