Based on many years of research and development work, Langer EMV-Technik was able to realize a new generation of IC probes at the beginning of 2020, which offers a flexible spring contact as a tip and visually verifiable contact detection. This enables significantly more precise contacting with the IC pin and measurements of ICs in BGA housings.
The conducted IC probes from Langer EMV-Technik GmbH can be used to carry out standardized evaluations of interference emission (IEC 61967) and interference immunity (IEC 62132; IEC 62215) as well as tests during development. These include 1/150 Ω conducted emission, DPI (direct power injection) and EFT pulse coupling.
Langer EMV-Technik GmbH can already look back on over 20 years of experience in the field of IC measurement technology and measurement services. During these years, the IC test system has been continuously developed and optimized with numerous measurement methods for conducted and field-bound IC tests. The IC test system includes measurement technology that can be used to carry out a wide range of EMC measurements on ICs, both conducted and field-based.
P750 HF voltmeter with new contact tip and contact detection
The high measurement dynamics and contacting accuracy of the new IC probes enable the automatic measurement of complex ICs with the ICT1 automatic IC tester. The ICT1 is a positioning system for IC measuring devices from Langer EMV-Technik GmbH for carrying out automated EMC tests on ICs.
If the IC sample is guided by hand, the contact detection can be activated via a button and visually checked using the integrated LED. Depending on the application and measurement task, it may be necessary to use different contact tips with different lengths, for example. This is also possible without any problems, as the spring contacts can be replaced quickly and easily using a screw connection.
The advantages of the further development summarized:
- Improved pin contact with more precise contacting (pitch up to 0.4 mm possible)
- Can be automated with ICT1 automatic IC tester
- Measurement of ICs in BGA housings
- Easily replaceable contact tip - individual contact tips are possible depending on the application
- Visual contact detection
Langer EMV-Technik GmbH was founded in 1998 as a spin-off from the engineering office founded by Gunter Langer in 1992 to offer the development and production of EMC measurement and testing technology as well as EMC consulting worldwide. The original engineering office, which was continued in parallel, has been integrated into the GmbH since 2019.
