White light interferometers detect the quality of surfaces directly in the production process - and save quality assurance time and money.
White light interferometers are in their element when it comes to testing the surface quality of the finest structures. Today, their advantages can also be used for 3D measurements of surface roughness directly during production, e.g. for quality control or process monitoring. Polytec has now added a special inline measuring system to the proven TopMap family. TopMap Rapid.View meets the highest requirements in terms of measuring time and resolution: Depending on the task and measuring range, measuring times in the seconds range can be realized. With a height measuring range of 400 µm, the microscope-based system with its high lateral resolution is ideal for precise inline roughness measurement. It recognizes the finest surface structures and keeps pace with fast production cycles. Scanning takes place in real time using complex algorithms on graphics cards. If the image field is reduced, the image repetition frequency can be accelerated to 3 kHz.
Easy to integrate and simple to operate: Even non-experts can cope
As the inline measuring system has a very compact design, it can be easily integrated into the production line. The compact measuring head can also be mounted and positioned separately like a sensor. This option leads to further flexible application examples.
Thanks to the many export options, the 3D measurement data can be processed with any suitable evaluation software. The TMS software, which was specially developed for these Polytec topography measuring systems, is very simple and practical to use and offers numerous options for evaluating the measurement results quickly and in accordance with ISO standards.
"Measurement recipes" simplify routine tasks. This turns complex surface analyses into simple one-click solutions. This saves time in the production environment, avoids operating errors and even non-experts can work with the measuring systems.
